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ADP system testing and QC [en]

a3258025-7700-410b-a013-7f53ac525a94@01.01.000

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Plateforme TianGong LCA, jeu de données : ADP system testing and QC [en], version 01.01.000, identifiant a3258025-7700-410b-a013-7f53ac525a94@01.01.000, disponible sur https://portal.tiangong.earth/fr/process/a3258025-7700-410b-a013-7f53ac525a94@01.01.000

Enregistrement
Données ouvertes
Nom dans les données source
Non renseigné
Produit ou flux de référence
Automatic data processing machines, comprising in the same housing at least a central processing unit and an input and output unit, whether or not combined [en]
Fournisseur de données
Tiangong LCA Data Working Group [en]
Périmètre et contexte
Données ouvertes
Unité fonctionnelle
1 kg
Région
Modeled as GLO due to unspecified plant location. If modeled for China, use Chinese grid electricity inventories (e.g., CLCD) to reflect local electricity production conditions as recommended in China-focused LCA practice (Nie 2013; Shi et al. 2018). [en] · Périmètre non précisé
Année de référence
2026
Description technologique
Finished ADP machine systems (e.g., system unit configured as a system) produced at a manufacturing plant as a production mix by assembling purchased/manufactured electronic and mechanical subassemblies into a tested, packaged finished product at the factory gate.; Functional testing, potential burn-in, and quality control of assembled ADP system units. Inclusion is driven by the route option list (functional test / burn-in / QC) and generic manufacturing chain examples that include inspection as a distinct step (as reflected in the provided SI example for composite door components showing trimming then inspection).; Flow represents a finished manufactured product at factory gate ('Finished product, manufactured') and modeled as a plant-level production mix ('Production mix, at plant').; Manufacturing is dominated by assembly/integration of subassemblies rather than primary materials production on-site.; Upstream electronics component manufacturing can be proxied/supplemented using electronics-component cradle-to-gate sources (e.g., aluminum electrolytic capacitors) where needed. [en]
Source et disponibilité
Données ouvertes
Licence
Free of charge for all users and uses
Enregistrement versionné
a3258025-7700-410b-a013-7f53ac525a94@01.01.000
Données ouvertes
Informations publiques disponibles