ProcessOpen data
ADP system testing and QC
a3258025-7700-410b-a013-7f53ac525a94@01.01.000
Citation
Versioned record
TianGong LCA Platform, dataset: ADP system testing and QC, version 01.01.000, identifier a3258025-7700-410b-a013-7f53ac525a94@01.01.000, available at https://portal.tiangong.earth/en/process/a3258025-7700-410b-a013-7f53ac525a94@01.01.000
Record
Open data
- Name in source data
- Not provided
- Reference product or flow
- Automatic data processing machines, comprising in the same housing at least a central processing unit and an input and output unit, whether or not combined
- Data provider
- Tiangong LCA Data Working Group
Scope and context
Open data
- Functional unit
- 1 kg
- Geography
- Modeled as GLO due to unspecified plant location. If modeled for China, use Chinese grid electricity inventories (e.g., CLCD) to reflect local electricity production conditions as recommended in China-focused LCA practice (Nie 2013; Shi et al. 2018). · Area not specified
- Reference year
- 2026
- Technology description
- Finished ADP machine systems (e.g., system unit configured as a system) produced at a manufacturing plant as a production mix by assembling purchased/manufactured electronic and mechanical subassemblies into a tested, packaged finished product at the factory gate.; Functional testing, potential burn-in, and quality control of assembled ADP system units. Inclusion is driven by the route option list (functional test / burn-in / QC) and generic manufacturing chain examples that include inspection as a distinct step (as reflected in the provided SI example for composite door components showing trimming then inspection).; Flow represents a finished manufactured product at factory gate ('Finished product, manufactured') and modeled as a plant-level production mix ('Production mix, at plant').; Manufacturing is dominated by assembly/integration of subassemblies rather than primary materials production on-site.; Upstream electronics component manufacturing can be proxied/supplemented using electronics-component cradle-to-gate sources (e.g., aluminum electrolytic capacitors) where needed.
Source and availability
Open data
- License
- Free of charge for all users and uses
- Versioned record
- a3258025-7700-410b-a013-7f53ac525a94@01.01.000
- Open data
- Public information available